Lunch & Learn: X-ray Diffraction & Surface Characterization

X-ray diffraction (XRD) is an analytical technique used to obtain information on material properties such as phase composition, crystal structure, texture, degree of crystallinity, and others. The technique deals with not only traditional powder XRD measurements, but also more advanced methods such as X-ray reflectivity (XRR), pair distribution function (PDF) analysis, small-angle X-ray scattering (SAXS) and non-ambient XRD. Non-ambient X-ray diffraction (NA-XRD) has become an indispensable technique to understand the influence of temperature, atmosphere or pressure on materials of any kind.

Indentation testing is one of the most common technique used to characterize surface material properties such as hardness and elastic modulus. Goal is to introduce the basics of nanoindentation technique and show a few typical applications in various industries.

Venue:

Carnegie Mellon University

Materials Characterization Facility, Microscopy Classroom,

Roberts Engineering Hall 124

Date: May 30, 2024

Time: 9:45 a.m. to 1: 00 p.m

Presenters:

XRD - Semih Gulec, Prasad Gosavi

Nano-Indentation - Haru Takano, Ryan Lambert

What to Expect:

During this seminar, you will hear an overview of the X-ray Diffraction and Nano-indentation techniques, related application examples, and overview of the experimental possibilities offered by Anton Paar XRDynamic 500 and HIT 300 instruments. The presentations will be followed by brief demonstration sessions in the lab

Agenda:

9:45am - Welcome and Opening Remarks

10am - XRD: Technique and Application examples. Know Your XRDynamic 500 - Experimental approach, Semih Gulec, Prasad Gosavi

11am - Scientific Talk: X-ray Methods for Materials Discovery

11:20am - Nano-indentation: Technique and Application Examples, Haru Takano, Ryan Lambert

11:40am - Lunch

12:15pm: Rotation through 3 Stations

Station 1 - XRDynamic 500 (15 minutes)

Station 2 - Non-ambient chambers (15 minutes)

Station 3 - Hit 300 (15 minutes)

Free. Registration is required.

Host or Publisher Anton Paar USA